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  5. PFK1060CX

Test Probe CX 3,0N Au 3,0mm CuBe

Varenummer:93-033
Varekode:PFK1060CX
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Inkl. moms
Kr. 131,25
v/5Kr. 82,03
v/25Kr. 65,63
v/100Kr. 55,78

PFK1060CX Test Probe CX 3,0N Au 3,0mm CuBePFK1060CX Test Probe CX 3,0N Au 3,0mm CuBe DimensionsPFK1060CX Test Probe CX 3,0N Au 3,0mm CuBe Probes
Features
Test probes are used in the electrical testing of dismantled and assembled PCBs, components and wired sections of corresponding test units.
Material
Barrel:
 Brass, Gold-plated
Spring:
 Spring Steel, Gold-plated
Plunger:
 CuBe
Receptacle:
 Brass, Gold-plated
Technical Specifications
Part Nr.
 Hmax
 Ha
 Fv
 Fa
 Imax
 Rtyp
  [mm]
 [mm]
 [N]
 [N]
 [A]
 [mW]
PFK1060CX 5,50
 4,40
 0,70
 3,00
 24,0
 �5
PFK1060FX 5,50
 4,40
 0,70
 3,00
 24,0
 �5
Hmax = Max. Travel, Ha = Working Travel, Fv = Pre-loaded Spring Force, Fa = Spring Force at Working Travel, Imax= Rated Current, Max., Rtyp = Contact Resistance, Typ.
Probe
Part Nr.
 Form
 Diameter
 Surface
    [mm]
  
PFK1060CX CX
 3,00
 Au
PFK1060FX FX
 2,30
 Au
PFK1060HGRL
Holder for Test Probe PFK1060_
Features
Holder with solder terminals
Manufacturer

http://www.ptr-messtechnik.de
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